Quantitative Cost Modeling of Error Protection for Network-on-Chip

Neuenhahn, M. C.; Lemmer, Daniel; Blume, H.; Noll, T. G.

Utrecht : STW, Stichting voor de Technische Wetenschappen (2007)
Buchbeitrag, Beitrag zu einem Tagungsband

In: Final program 2007 / ProRISC 2007, SAFE 2007 : 18th Annual Workshop on Circuits, Systems and Signal Processing ; 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors ; November 29 - 30, 2007, Veldhoven, The Netherlands ; overview of the workshops / organized by STW ...
Seite(n)/Artikel-Nr.: 331-337

Identifikationsnummern

Quellen