3D X-ray computerized tomography of White Etching Cracks (WEC)
Danielsen, H. K. (Corresponding author); Carrasco, A. J.; Fæster, S.; Dahl, K. V.; Gutierrez Guzman, Francisco Gerardo Antonio; Sauvage, Paul; Jacobs, Georg
New York, NY : Science Direct (2019)
Journal Article
In: Materials characterization
Volume: 150
Page(s)/Article-Nr.: 78-87
Identifier
- DOI: 10.1016/j.matchar.2019.01.032
- RWTH PUBLICATIONS: RWTH-2019-02464