Young's modulus and electronmicroscopy measurements on ultra-thin reaction layers

Gold, Peter Werner; Loos, Jörg; Wolf, Thomas; Klaas, Helge; Aretz, A.; Mayer, Joachim; Reichelt, M.; Weirich, Th.; Richter, S.; Bückins, M.

Contribution to a conference proceedings

In: t Nanomech 5, Hückelhoven, 2004, Symposium Programm
Page(s)/Article-Nr.: 52-52


  • Chair and Institute for Machine Elements and Systems Engineering [411710]